![a The test circuit used to measure the reverse recovery characteristics... | Download Scientific Diagram a The test circuit used to measure the reverse recovery characteristics... | Download Scientific Diagram](https://www.researchgate.net/publication/330773681/figure/fig3/AS:721331196809217@1548990167347/a-The-test-circuit-used-to-measure-the-reverse-recovery-characteristics-of-vertical-SBDs.png)
a The test circuit used to measure the reverse recovery characteristics... | Download Scientific Diagram
![Reverse‐Recovery Analysis of Parallel‐Connected pin Diodes Using a Physics‐Based Device Model - Horiguchi - 2014 - Electronics and Communications in Japan - Wiley Online Library Reverse‐Recovery Analysis of Parallel‐Connected pin Diodes Using a Physics‐Based Device Model - Horiguchi - 2014 - Electronics and Communications in Japan - Wiley Online Library](https://onlinelibrary.wiley.com/cms/asset/3f23af9a-284a-4baf-ae21-8088ba7191cb/ecj11499-fig-0001-m.jpg)
Reverse‐Recovery Analysis of Parallel‐Connected pin Diodes Using a Physics‐Based Device Model - Horiguchi - 2014 - Electronics and Communications in Japan - Wiley Online Library
![Figure 3 from On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP) | Semantic Scholar Figure 3 from On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP) | Semantic Scholar](https://d3i71xaburhd42.cloudfront.net/f4bf951bd00981523be59cceda82d2a0dc69fddb/3-Figure3-1.png)